Measuring manganite’s electronic response Phase-separated material may see application in novel sensors and memory devices
Device structure of manganite thin film showing phase separation © Masashi Kawasaki
Electronic responses from metallic domains, insulating domains, and their interfaces are successfully measured in a phase-separated manganese oxide thin film by investigating capacitance change against the frequency of applied AC electric fields. The achievement was realized by Yoshinori Tokura (professor at the University of Tokyo Department of Applied Physics and group director of Riken), Masashi Kawasaki (professor at the University of Tokyo Department of Applied Physics and team leader of the RIKEN strongly correlated interface device team), researcher Zhigao Sheng and Masao Nakamura from the RIKEN cross-correlated superstructure research team, and Fumitaka Kagawa (lecturer at the University of Tokyo Department of Applied Physics). This achievement is important in understanding electronic properties in a phase-separated state, and also may pave the way for applications in novel memory devices and sensors exploiting phase-separated phenomena.
Paper
Zhigao Sheng, Masao Nakamura, Fumitaka Kagawa, Masashi Kawasaki ,Yoshinori Tokura,
“Dynamics of multiple phases in a colossal-magnetoresistive manganite as revealed by dielectric spectroscopy”,
Nature Communications Online Edition: 2012/7/10 (Japan time), doi: 10.1038/ncomms1943.
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