Advanced Nanocharacterization Platform in the University of Tokyo


- 3.7 Advanced Device/Material Evaluation Measurement Techniques (SEM, AFM, OCD, TEM, etc.)
Yuichi Ikuhara
Graduate School of Engineering
Professor
The state-of-the-art nanocharacterization equipments such as atomic resolution electron microscopes for semiconductor devices, nanotechnology, and materials science are shared nationwide, and many researches are widely supported.
Related links
Research collaborators
- K.Takiguchi et al., “Giant gate-controlled proximity magnetoresistance in semiconductor-based ferromagnetic–non-magnetic bilayers,” Nat. Phys., 15, 1134-1139 (2019).
- T. Makita et al., “High-performance, semiconducting membrane composed of ultrathin, single-crystal organic semiconductors,” PNAS, 117, 80-85 (2020).
- A. Kumamoto et al., “Atomic structures of a liquid-phase bonded metal/nitride heterointerface,” Sci. Rep., 6, 22936 (2016).
SDGs
Contact
- Naoya Shibata School of Engineering,
- Tel: +81-3-5841-0415
- Email: shibata[at]sigma.t.u-tokyo.ac.jp
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