Advanced Nano-characterization Platform at the University of Tokyo
- 2.1 Quantum bits, memories, devices(Superconducting circuits, Ion trapping, Trapped cold atoms, Photons, Quantum dots, etc.)
- 2.2 Quantum sensing(Quantum metrology/Sensing/Imaging, Optical lattice clocks)
- 2.3 Quantum materials(Topological materials/Thermoelectric devices/Functional materials)
- 2.5 Quantum wiring/Quantum electronics/Electronics for Quantum Information
Yuichi Ikuhara
Graduate School of Engineering
Professor
State-of-the-art nano-characterization equipment such as atomic resolution electron microscopes for nanotechnology and material science are shared nationwide, and numerous studies are widely supported.
Advanced Nanocharacterization Platform
Advanced Nanocharacterization Platform
Related links
Related publications
R. Xiang et al., ”One-dimensional van der Waals heterostructures,” Science, 367, 537-542 (2020).
D. Yin et al., “Ceramic phases with one-dimensional long-range order,” Nature Mater., 18, 19-23 (2019).
A. Kumamoto et al., “Advanced Nanocharacterization Platform in the University of Tokyo,” Materia, 58, 727-732 (2019). (In Japanese)
D. Yin et al., “Ceramic phases with one-dimensional long-range order,” Nature Mater., 18, 19-23 (2019).
A. Kumamoto et al., “Advanced Nanocharacterization Platform in the University of Tokyo,” Materia, 58, 727-732 (2019). (In Japanese)
